Metasurfaces play an important role in the development of future optical systems. The design and manufacturing of these advanced surfaces represent critical steps in the innovation process, as their characterization is essential for ensuring optimal performance. Depending on the specific application, the required level of accuracy can vary significantly, with different critical factors influencing the outcomes. In the proposed master thesis two distinct procedures for characterization are addressed:

• Functional characterization assessing the performance of the meta-element within the optical system.

• Meta-element characterization focusing on the nanostructure's geometry and optical properties independently of the optical system.

As part of this master's thesis, you will have the opportunity to develop, test, and implement innovative algorithms, benchmark them, conduct proof-of-principle experiments on a prototype, and evaluate alternative metrology schemes centered around phase retrieval techniques. The preparation and execution of experiments in collaboration with external partners, along with the analysis of results - including comparisons between different metrology techniques - will form the core of this metrology project. This work will be fully integrated into the project process flow, encompassing everything from design to experimental validation. We invite you to join us in this exciting endeavor, where your contributions will play a vital role in advancing the field of metasurface technology.

Your role

• Landscaping metrology solutions in the scientific and patent literature for optical meta-elements

• Setting up a simulation environment based on commercial Maxwell solvers to investigate sensitivities, accuracy, and compare to more standard methods of phase measurements.

• Selecting and developing algorithm and methods to support metasurface design for various applications

• Experimental comparison on test structures of the different metrology techniques investigated within ZEISS and with external partners.

• Take part in the discussion, preparation and execution of experiments

• Data analysis - Examine measurement results to find trends or problems.

• Documentation of the algorithms developed and results

Your Profile

• A background in Mathematics (optimization, statistics, inverse problem) and/or Wave Physics (Electromagnetic, interferometry, photonics,…)

• Ideally a bachelor's degree in one of the above subjects and experience in metrology is a plus

• Interest in developing in-depth knowledge of optical metrology principles

• Applied knowledge in Python, MATLAB

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As a student, you will work on an equal footing with your colleagues, you will gain deep insights into a company that creates products for the world of tomorrow, and you will create ideal conditions for your later career. You will be responsible and have freedom for investigation new ideas and techniques within the metrology module of the project.

Your ZEISS Recruiting Team: